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Microstructure characterisation has been greatly enhanced through the use ofelectron backscatter diffraction (EBSD), where rich maps are generated throughanalysis of the crystal phase and orientation in the scanning electronmicroscope (SEM). Conventional EBSD analysis involves raster scanning of theelectron beam and the serial analysis of each diffraction pattern in turn. Forgrain shape, crystallographic texture, and microstructure analysis this can beinefficient. In this work, we present Rapid EBSD, a data fusion approachcombining forescatter electron (FSE) imaging with static sparse sampling ofEBSD patterns. We segment the FSE image into regions of similar colour (i.e.phase and crystal orientation) and then collect representative EBSD data foreach segmented region. This enables microstructural assessment to be performedat the spatial resolution of the (fast) FSE imaging whilst includingorientation and phase information from EBSD analysis of representative points.We demonstrate the Rapid EBSD technique on samples of a cobalt based superalloyand a strained dual phase titanium alloy, comparing the results withconventional analysis. Rapid EBSD is advantageous for assessing grain sizedistributions in time-limited experiments.

Rapid Electron Backscatter Diffraction Mapping: Painting by Numbers