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The impact of semiconductor surface roughness on the electrical and thermalcontact resistances and thermoEMF of thermoelectric material (TEM)-metaltransient contact layer is studied theoretically. The distribution of hollowsand humps on the rough surface is simulated by the truncated Gaussiandistribution. The impact of distribution parameters on the electrical contactresistance and thermoEMF of thermoelectric material-metal contact is studied.

Estimation of the electrical and thermal contact resistances and  thermoemf of thermoelectric material-metal transient contact layer due to  semiconductor surface rougness