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Test suite reduction (TSR) aims at removing redundant test cases fromregression test suites. A typical TSR approach ensures that structural profileelements covered by the original test suite are also covered by the reducedtest suite. It is plausible that structural profiles might be unable tosegregate failing runs from passing runs, which diminishes the effectiveness ofTSR in regard to defect detection. This motivated us to explore state profiles,which are based on the collective values of program variables. This paperpresents Substate Profiling, a new form of state profiling that enhancesexisting profile-based analysis techniques such as TSR and coverage-based faultlocalization. Compared to current approaches for capturing program states,Substate Profiling is more practical and finer grained. We evaluated ourapproach using thirteen multi-fault subject programs comprising 53 defects. Ourstudy involved greedy TSR using Substate profiles and four structural profiles,namely, basic-block, branch, def-use pair, and the combination of the three.For the majority of the subjects, Substate Profiling detected considerably moredefects with a comparable level of reduction. Also, Substate profiles werefound to be complementary to structural profiles in many cases, thus, combiningboth types is beneficial.

Substate Profiling for Effective Test Suite Reduction