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A novel method for measuring the surface coverage of randomly distributedcylindrical nanoparticles such as nanorods and nanowires, using atomic forcemicroscopy (AFM), is presented. The method offers several advantages overexisting techniques such as particle beam and x-ray diffraction spectroscopy.These include, subnanometer vertical and lateral resolution, non destructiveinteraction with the sample surface allowing repeated measurements,user-friendly setup and ambient operating conditions. The method relies on theuse of a statistical model to describe the variations of the nanoparticlesaggregates height as a function of x,y position on the sample surface measuredby AFM. To verify the validity of the method we studied two types of randomlyoriented networks of carbon nanotubes (CNTs) and silver nanowires (Ag NWs) bothprocessed from solution phase. Experimental results are found to be inexcellent agreement with model predictions whilst analysis of the measuredsurface height density, together with the nanoparticle diameter statisticaldistribution, allow the extraction of the coverage coefficients for alldetected nanoparticle aggregates as well as for the total surface coverage. Themethod can be seen as a new powerful tool for the quantitative surface coverageanalysis of arbitrary nanoscale systems.

A novel method for surface coverage spectroscopy with atomic force  microscope: theory, modeling and experimental results for cylindrical  nanostructures