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We report observation of graphene plasmon interference fringes across a widespectral range using a scattering scanning near-field optical microscope(s-SNOM) that employs a widely tunable bank of quantum cascade lasers. We useplasmon interference to measure the dispersion curve of graphene plasmons overmore than an order of magnitude of plasmon wavelength, from $\lambda_{sp}$ ~140to ~1700 nm, and extract the electron Fermi energy of 298$\pm$4 meV forhydrogen-intercalated single layer epitaxial graphene on SiC. Furthermore, wedemonstrate the appearance of wavelength tuneable graphene plasmon reflection"hotspots" at single-layer/bi-layer interfaces. This work demonstrates thecapability of wide-band nano-imaging to precisely measure the electricalproperties of graphene and spatially control plasmon reflection focusing.

Wide-Band Nano-Imaging of Plasmon Dispersion and Hotspots in Quasi-Free-Standing Epitaxial Graphene