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Measurements of charge-carrier lifetime in many early-stage thin-filmphotovoltaic materials can be arduous due to the prevalence of defects andlimited information about material properties. In this perspective, we give abrief overview of typical techniques for measuring lifetimes and discuss theintuition involved in estimating lifetimes from such techniques, focusing ontime-resolved photoluminescence as an example. We then delve into theunderlying assumptions and uncertainties involved in analyzing lifetimemeasurements. Finally, we outline opportunities for improving accuracy oflifetime measurements by utilizing two emerging techniques to decoupledifferent recombination mechanisms: two-photon spectroscopy, which wedemonstrate on BiI3 thin films, and temperature- and injection-dependentcurrent-voltage measurements.

Charge-carrier lifetime measurements in early-stage photovoltaic materials: intuition, uncertainties, and opportunities