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Angle-resolved photoemission spectroscopy (ARPES) is the keymomentum-resolved technique for direct probing of the electronic structure of amaterial. However, since it is very surface-sensitive, it has been applied to arelatively small set of complex oxides that can be easily cleaved in ultra-highvacuum. Here we describe a new multi-module system at Brookhaven NationalLaboratory (BNL) in which an oxide molecular beam epitaxy (OMBE) isinterconnected with an ARPES and a spectroscopic-imaging scanning tunnelingmicroscopy (SI-STM) module. This new capability largely expands the range ofcomplex-oxide materials and artificial heterostructures accessible to these twomost powerful and complementary techniques for studies of electronic structureof materials. We also present the first experimental results obtained usingthis system - the ARPES studies of electronic band structure of aLa$_{2-x}$Sr$_x$CuO$_4$ (LSCO) thin film grown by OMBE.

In-situ angle-resolved photoemission spectroscopy of copper-oxide thin films synthesized by molecular beam epitaxy