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Emergent phenomena at interfaces between oxides and metals can appear due tocharge transfer and mass transport that modify the bulk properties. By coatingthe metallic oxide LaNiO$_3$ by aluminium, we fabricated a junction exhibitinga diode-like behaviour. At the equilibrium, the interface is insulating. Themetallic behaviour can be recovered by applying a voltage drop across thejunction in one polarity only. The electrical properties in direct and reversebias are investigated. The observed electro-resistive effect rises up to $10^5$\% and can be interpreted in terms of (i) a spontaneous redox reactionoccurring at the interface and (ii) its reversal induced by charge injection indirect bias.

Redox reaction enhanced Schottky contact at a \LNO{}(001)/Al interface