English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Single crystal epitaxial thin films of UN and U$_2$N$_3$ have been grown forthe first time by reactive DC magnetron sputtering. These films provide idealsamples for fundamental research into the potential accident tolerant fuel, UN,and U$_2$N$_3$, its intermediate oxidation product. Films were characterisedusing x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), withXRD analysis showing both thin films to be [001] oriented and composed of asingle domain. The specular lattice parameters of the UN and U$_2$N$_3$ filmswere found to be 4.895\,\AA{} and 10.72\,\AA{}, respectively, with the UN filmhaving a miscut of 2.6\,$^\circ$. XPS showed significant differences in theN-1s peak between the two films, with area analysis showing both films to bestoichiometric.

Epitaxial UN and $\alpha$-U$_2$N$_3$ Thin Films