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Optoelectronic phenomena in materials such as organic/inorganic hybridperovskites depend on a complex interplay between light induced carriergeneration and fast (electronic) and slower (ionic) processes, all of which areknown to be strongly affected by structural inhomogeneities such as interfacesand grain boundaries. Here, we develop a time resolved Kelvin probe forcemicroscopy (KPFM) approach, based on the G-Mode SPM platform, allowingquantification of surface photovoltage (SPV) with microsecond temporal andnanoscale spatial resolution. We demonstrate the approach on methylammoniumlead bromide (MAPbBr3) thin films and further highlight the usefulness ofunsupervised clustering methods to quickly discern spatial variability in theinformation rich SPV dataset. Using this technique, we observe concurrentspatial and ultra-fast temporal variations in the SPV generated across the thinfilm, indicating that structure is likely responsible for the heterogenousbehavior.

Mapping fast evolution of transient surface photovoltage dynamics using G-Mode Kelvin probe force microscopy