English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

This paper presents multiple-modes Scanning Probe Microscopy (SPM) studies oncharacterize resistance switching (RS), polarization rotation (PO) and surfacepotential changes in copper doped ZnO (ZnO:Cu) thin films. The bipolar RSbehavior is confirmed by conductive Atomic Force Microscopy (c-AFM). The POwith almost 180{\deg} phase angle is confirmed by using the vertical andlateral Piezoresponse Force Microscopy (PFM). In addition, it elucidates thatobvious polarization rotation behavior can be observed in the sample withincreasing Cu concentration. Furthermore, correlation of the RS behavior withPO behavior has been studied by performing various mode SPM measurements on thesame location. The electric field resulted from the opposite polarizationorientation are corresponded to the different resistance states. It is foundthat the region with the polarization in downward direction has low resistancestate (LRS), whereas the region with upward polarization has high resistancestate (HRS). In addition, the Piezoresponse Force Spectroscopy (PFS) andSwitching Spectroscopy PFM (SS-PFM) measurements further confirm that theexistence of the built-in field due to the uncomplemented polarization mayaffect the depletion region and hence contribute to the RS behavior. Inaddition, Kelvin Probe Force Microscopy (KPFM) results show that, whenZnO-based thin films is subjected to negative and then followed by positivesample bias, injection charge limit current is dominated.

Multiple-Modes Scanning Probe Microscopy Characterization of Copper doped Zinc Oxide (ZnO:Cu) Thin Films