English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

The Refl1d program is used for modeling and fitting data from neutron andX-ray reflectometry experiments. The model of the (thin-film) samples istypically constructed of discrete layers of different scattering-lengthdensities (SLD). Interlayer roughness is represented as an error-functiontransition from one layer to the next. Previous versions of the softwaretruncated this error-function at the next interface. This strategy has theadvantage of preventing layers with unbounded effective extent, but it can alsoresult in SLD depth profiles that do not conform to the physical expectationsof the users (such as introducing sharp transitions) whenever the layerroughness approaches the thickness of the layer. In this article we introduce anew version of the software in which the option is provided to extend theroughness of each layer over the entire structure; the resulting SLD profilesoften more closely resemble the physical models intended by the user. Mostimportantly no sharp transitions are introduced by truncating the roughness,when a smooth transition is often desired when adding rough layers together.

Distributed Error-Function Roughness in Refl1d Reflectometry Fitting Program