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Atomic force microscopy is based on tip sample interaction, which isdetermined by the properties of tip and sample. Unfortunately, in particular inambient conditions the tip as well as the sample are contaminated, and it isnot clear how this contamination may affect data in Atomic Force Microscopy(AFM) applications. In the present work we propose to use on the one hand AFMimaging of the cantilever chips and on the other hand multidimensional AFMspectroscopy techniques to characterize the state of contamination of the tipsample system. We find that typically AFM cantilevers may be severelycontaminated when taken from typical packaging boxes that have been opened fora long time. In addition, by acquisition spectroscopy data as a function oftip-sample voltage and tip-sample distance, we are able to determine theHamaker constant of the system, which depends strongly on the contaminationwithin the tip-sample system. This method allows for in-situ characterizationof the tip-sample system using only AFM techniques.

In-situ characterization of contamination within an Atomic Force Microscope tip-sample system