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Recent advances in the technology of transmission electron microscopy haveallowed for a more precise visualization of materials and physical processes,such as metal oxidation. Nevertheless, the quality of information is limited bythe damage caused by an electron beam, movement of the specimen or otherenvironmental factors. A novel registration method has been proposed to removethose limitations by acquiring a series of low dose microscopy frames andperforming a computational registration on them to understand and visualize thesample. This process can be represented as a prefix sum with a complex andcomputationally intensive binary operator and a parallelization is necessary toenable processing long series of microscopy images. With our parallelizationscheme, the time of registration of results from ten seconds of microscopyacquisition has been decreased from almost thirteen hours to less than sevenminutes on 512 Intel IvyBridge cores.

Parallel Prefix Algorithms for the Registration of Arbitrarily Long Electron Micrograph Series