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ZrSiS is the most intensively studied topological nodal-line semimetalcandidate, which is proposed to host multiple nodal lines in its bulkelectronic structure. However, previous angle-resolved photoemissionspectroscopy (ARPES) experiments with vacuum ultraviolet lights mainly probedthe surface states. Here using bulk-sensitive soft X-ray ARPES, we acquire thebulk electronic states of ZrSiS without any interference from surface states.Our results clearly show two groups of three-dimensional bulk nodal lineslocated on high-symmetry planes and along high-symmetry lines in the bulkBrillouin zone, respectively. The nodal lines on high-symmetry planes areenforced to pin at the Fermi level by carrier compensation and constitute thewhole Fermi surfaces. This means that the carriers in ZrSiS are entirelycontributed by nodal-line fermions, suggesting that ZrSiS is a remarkableplatform for studying physical properties related to nodal lines.

Observation of bulk nodal lines in topological semimetal ZrSiS