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Transition to temporal resolution on the order of 1 ps or less raises anumber of questions associated with estimation of the accuracy of the dynamicparameters based on the analysis of time-dependent scattering intensity. Theuse of ultrashort pulses leads to the necessity for increasing the totalexposure time and lengthening the time of data acquisition. This can be to someextent mitigated by increasing the charge per pulse. Increasing in the numberof electrons, however, is limited by the Coulomb repulsion between them, whichleads on one hand, to distortion of the diffraction pattern, and the other handto increase the duration of the pulse. The analytical technique for estimatingthe deformation of the diffraction pattern caused by the Coulomb repulsion ofthe electrons in the electron bunch with duration of less than 10 ps, and theinfluence of this effect on the accuracy of determination of the interatomicdistances is developed.

The influence of the Coulomb interaction in electron bunch on the structural parameters determined by time-resolved electron diffraction