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Skyrmions in ultrathin ferromagnetic metal (FM)/heavy metal (HM) multilayersystems produced by conventional sputtering methods have recently generatedhuge interest due to their applications in the field of spintronics. Thesandwich structure with two correctly-chosen heavy metal layers provides anadditive interfacial exchange interaction which promotes domain wall orskyrmion spin textures that are N\'eel in character and with a fixed chirality.Lorentz transmission electron microscopy (TEM) is a high resolution methodideally suited to quantitatively image such chiral magnetic configurations.When allied with physical and chemical TEM analysis of both planar andcross-sectional samples, key length scales such as grain size and the chiralvariation of the magnetisation variation have been identified and measured. Wepresent data showing the importance of the grain size (mostly < 10nm) measuredfrom direct imaging and its potential role in describing observed behaviour ofisolated skyrmions (diameter < 100nm). In the latter the region in which themagnetization rotates is measured to be around 30 nm. Such quantitativeinformation on the multiscale magnetisation variations in the system is key tounderstanding and exploiting the behaviour of skyrmions for future deviceapplications.

A transmission electron microscope study of N\'eel skyrmion magnetic  textures in multilayer thin film systems with large interfacial chiral  interaction