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We have discovered two novel types of planar defects that appear inheteroepitaxial YBa$_2$Cu$_3$O$_{7-\delta}$ (YBCO123) thin films, grown bypulsed-laser deposition (PLD) either with or without aLa$_{2/3}$Ca$_{1/3}$MnO$_3$ (LCMO) overlayer, using the combination ofhigh-angle annular dark-field scanning transmission electron microscopy(HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping forunambiguous identification. These planar lattice defects are based on theintergrowth of either a BaO plane between two CuO chains or multiple Y-O layersbetween two CuO$_2$ planes, resulting in non-stoichiometric layer sequencesthat could directly impact the high-$T_c$ superconductivity.

Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_2$Cu$_3$O$_{7-\delta}$ thin films