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We show that by a simple two-steps measurement protocol one can extract thethermal properties of anisotropic insulator materials. We focus on Bi2Se3single crystal, a layered crystal with individual sheets held together by Vander Waals force, presenting strong heat diffusion anisotropy. Since the shapeof the sample does not allow experiments in the perpendicular direction thechallenge is to measure the in plane and out of plane thermal properties by inplane measurements. The optical properties of Bi2Se3 being known (opaque samplefor the pump and probe beams), thermoreflectance microscopy experiments can bedone on the bare substrate. In this case, the lateral heat diffusion isgoverned by the in plane thermal diffusivity. A 100 nm gold layer is thendeposited on the sample. In this second experiment it is straightforward todemonstrate that the perpendicular thermal properties of the layer rule thelateral diffusivity. The good agreement of theoretical curves obtained bythermal models with experimental data permit us to evaluate the thermalconductivity coefficients of bulk Bi2Se3.

Straightforward measurement of thermal properties of anisotropic materials: the case of Bi2Se3 single crystal