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We report grazing incidence small angle neutron scattering (GISANS) andcomplementary off-specular neutron reflectometry (OSR) of the magnetic order ina single-crystalline epitaxial MnSi film on Si(111) in the thick film limit.Providing a means of direct reciprocal space mapping, GISANS and OSR reveal amagnetic modulation perpendicular to the films under magnetic fields paralleland perpendicular to the film, where additional polarized neutron reflectometry(PNR) and magnetization measurements are in excellent agreement with theliterature. Regardless of field orientation, our data does not suggest thepresence of more complex spin textures, notably the formation of skyrmions.This observation establishes a distinct difference with bulk samples of MnSi ofsimilar thickness under perpendicular field, in which a skyrmion latticedominates the phase diagram. Extended x-ray absorption fine structuremeasurements suggest that small shifts of the Si positions within theunstrained unit cell control the magnetic state, representing the maindifference between the films and thin bulk samples.

Reciprocal space mapping of magnetic order in thick epitaxial MnSi films