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We propose a precise ellipsometric method for the investigation of coherentlight with a small ellipticity. The main feature of this method is the use ofcompensators with phase delays providing the maximum accuracy of measurementsfor the selected range of ellipticities and taking into account theinterference of multiple reflections of coherent light. The relative error ofthe ellipticity measurement in the range of mesurement does not exceed 0.02.

New ellipsometric approach for determining small light ellipticities