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Whilst there have been several reports of the spin Seebeck effect to date,comparison of the absolute voltage(s) measured, in particular for thin films,is limited. In this letter we demonstrate normalization of the spin Seebeckeffect for Fe$_3$O$_4$:Pt thin film and YIG:Pt bulk samples with respect to theheat flux J$_q$, and temperature difference $\Delta$T. We demonstrate that thestandard normalization procedures for these measurements do not account for anunexpected scaling of the measured voltage with area that is observed in bothbulk and thin film. Finally, we present an alternative spin Seebeck coefficientfor substrate and sample geometry independent characterization of the spinSeebeck effect.

Scaling of the spin Seebeck effect in bulk and thin film