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Three properties of the dielectric relaxation in ultra-pure singlecrystalline H$_{2}$O ice Ih were probed at temperatures between 80-250 K; thethermally stimulated depolarization current, static electrical conductivity,and dielectric relaxation time. The measurements were made with a guardedparallel-plate capacitor constructed of fused quartz with Au electrodes. Thedata agree with relaxation-based models and provide for the determination ofactivation energies, which suggest that relaxation in ice is dominated byBjerrum defects below 140 K. Furthermore, anisotropy in the dielectricrelaxation data reveals that molecular reorientations along thecrystallographic $c$-axis are energetically favored over those along the$a$-axis between 80-140 K. These results lend support for the postulate of ashared origin between the dielectric relaxation dynamics and the thermodynamicpartial proton-ordering in ice near 100 K, and suggest a preference forordering along the $c$-axis.

Anisotropic Dielectric Relaxation in Single Crystal H$_{2}$O Ice Ih from 80-250 K