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Mid-infrared nano-imaging and spectroscopy of two-dimensional (2D) materialshave been limited so far to scattering-type Scanning Near-field OpticalMicroscopy (s-NSOM) experiments where light from the sample is scattered by ametallic-coated Atomic Force Microscope (AFM) tip interacting with the materialat the nanoscale. These experiments have recently allowed imaging of plasmonpolaritons in graphene as well as hyperbolic phonon polaritons (HP2) inhexagonal Boron Nitride (hBN). Here we show that the high mechanicalsensitivity of an AFM cantilever can be exploited for imaging hyperbolic phononpolaritons in hBN. In our imaging process, the lattice vibrations of hBNmicrometer-sized flakes are locally enhanced by the launched phonon polaritons.These enhanced vibrations are coupled to the AFM tip in contact to the samplesurface and recorded during scanning. Imaging resolution better than{\lambda}/20 is showed, comparable to the best resolution in s-NSOM.Importantly, this detection mechanism is free from light background and it isin fact the first photon-less detection of phonon polaritons.

Mechanical detection and imaging of hyperbolic phonon polaritons in hexagonal Boron Nitride