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As the photovoltaic community accelerates the development of new absorbercandidate materials towards high-performing PV devices, it is essential tofollow best practices and leverage deeper characterization tools. We haveidentified temperature- and illumination-dependent current density-voltage$J$($V$,$T$,$i$) and electron-beam induced current (EBIC) measurements as twopowerful PV device characterization techniques to evaluate the potential ofnovel absorber candidate materials. Herein, we focus on the experimentalmethods and best practices for applying $J$($V$,$T$,$i$) and EBIC, addressingparticular challenges in sample preparation and mounting. We demonstrate theseon the example of tin monosulfide, a promising PV absorber candidate materialthat shares characteristics of many novel thin-film PV absorbers: mechanicallysoft, polycrystalline, and used in heterojunction thin-film PV devices.

Best practices for the application of temperature- and  illumination-dependent current density-voltage $J$($V$,$T$,$i$) and  electron-beam induced current EBIC to novel thin film solar cells