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This paper starts with a comprehensive survey on RTL ATPG. It then proposes anovel RTL ATPG model based on "Gate Inherent Faults" (GIF). These GIF areextracted from each complex gate (adder, case-statement, etc.) of the RTLsource code individually. They are related to the internal logic paths of acomplex gate. They are not related to any net/signal in the RTL design. It isobserved, that when all GIF on RTL are covered (100%) and the same stimulus isapplied, then all gate level stuck-at faults of the netlist are covered (100%)as well. The proposed RTL ATPG model is therefore synthesis independent. Thisis shown on ITC'99 testcases. The applied semi-automatic test patterngeneration process is based on functional simulation.

A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO) of Complex Gates