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We investigated coercive fields of 200nm x 1200nm x 5nm rectangularnanocrystalline thin films as a function of grain size D using finite elementssimulations. To this end, we created granular finite element models with grainsizes ranging from 5nm to 60nm, and performed micromagnetic hysteresiscalculations along the y-axis (easy direction) as well as along the x-axis(hard direction). We then used an extended Random Anisotropy model to interpretthe results and to illustrate the interplay of random anisotropy and shapeinduced anisotropy, which is coherent on a much larger scale, in thin films.

Grain structure dependence of coercivity in thin films