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The current driven motion of skyrmions in MnSi and FeGe thinned singlecrystals could be initiated at current densities of the order of $10^6$ A/m,five orders of magnitude smaller than for magnetic domain walls. Thetechnologically crucial step of replicating these results in thin films has notbeen successful to date, but the reasons are not clear. Elucidating themrequires analyzing system characteristics at scales of few nm where the keyDzyaloshinskii Moriya (DM) interactions vary, and doing so in near applicationconditions, i.e. oxidation protected systems at room temperature. In thiswork's magnetic force microscopy (MFM) studies of magnetron sputtered Ir/Co/Ptmultilayers we show skyrmions that are smaller than previously observed, arenot circularly symmetric, and are pinned to 50 nm wide areas of 75 percenthigher than average DM interaction. This finding matches our measurement of Colayer thickness inhomogeneity of the order of $\pm$1.2 atomic monolayers per0.6 nm layer, and indicates that layer flatness must be controlled with greaterprecision to preclude skyrmion pinning.

How to measure the local Dzyaloshinskii Moriya Interaction in Skyrmion Thin Film Multilayers