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Nanoparticles (NPs) are widely used in diverse application areas, such asmedicine, engineering, and cosmetics. The size (or volume) of NPs is one of themost important parameters for their successful application. It is relativelystraightforward to determine the volume of regular NPs such as spheres andcubes from a one-dimensional or two-dimensional measurement. However, due tothe three-dimensional nature of NPs, it is challenging to determine the properphysical size of many types of regularly and irregularly-shaped NPs (IS-NPs) athigh-throughput using a single tool. Here, we present a relatively simplemethod that statistically determines a better volume estimate of many types ofNPs by combining measurements from their top-down projection areas andpeak-heights using two tools. The proposed method is significantly faster andmore economical than the electron tomography method. We demonstrate theimproved accuracy of the combined method over scanning electron microscopy(SEM) and atomic force microscopy (AFM) by using both modeling andmeasurements. This study also shows that SEM provides a more accurate estimateof size than AFM for most IS-NP size measurements. The method provides a muchneeded, proper high-throughput volumetric measurement method useful for manyapplications.

A Better Method for Volume Determination of Regularly and Irregularly Shaped Nanoparticles with Enhanced Accuracy