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X-ray-induced photoemission in materials research is commonly acknowledged asa method with a probing depth limited by the escape depth of thephotoelectrons. This general statement should be complemented with exceptionsarising from the distribution of the X-ray wavefield in the material. Here weshow that the integral hard-X-ray-induced photoemission yield is modulated bythe Fresnel reflectivity of a multilayer structure with the signal originatingwell below the photoelectron escape depth. A simple electric self-detection ofthe integral photoemission yield and Fourier data analysis permit extraction ofthicknesses of individual layers. The approach does not require detection ofthe reflected radiation and can be considered as a framework for non-invasiveevaluation of buried layers with hard X-rays under grazing incidence.

X-ray-induced photoemission yield for surface studies of solids beyond the photoelectron escape depth