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We present an X-band waveguide (WR90) and UHF waveguide (WR1500) measurementmethod that permits the extraction of the complex permittivity for lowdielectric loss tangent material specimen. The extraction method relies oncomputational electromagnetic (CEM) simulations; coupled with a geneticalgorithm; to fit the experimental measurement and the simulated transmittedscattering parameter (S21) of the TE10 mode through the waveguide with thematerial specimen partially filling the cross-section. This technique providesthe material measurement community with the ability to accurately extractmaterial properties of low-loss material specimen.

iQ Cavity for Material Permittivity Characterization