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In this paper, we have presented the impact of swift heavy ion beamirradiation on the structural, microstructural, electrical and magneticproperties of $Sn_{0.9}Mn_{0.1}O_{2}$ thin films. The structural and electricalresults have been interpreted by using properties of native or point defects,whereas the magnetic and morphological variations have been explained in termsof conductivity of material. Efforts have been made to summarize the propertiesof all possible charged and neutral point defects ($V_{Sn}^{4-}$,$Sn_{i}^{4+}$, $V_{O}^{0}$, $O_{i}^{2-}$, $Sn_{O}^{4+}$, $O_{Sn}^{2-}$,$H_{O}^{+}$) and afterwards from the correlation betweenexperimentally-observed and theoretically-calculated results variousinteresting conclusions have been drawn.

Swift Heavy Ion Irradiation Induced Modifications in Structural,  Microstructural, Electrical and Magnetic Properties of Mn Doped $SnO_{2}$  Thin Films