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The spatial and the angular variants of the Goos-H\"anchen (GH) and theImbert-Federov (IF) beam shifts contribute in a complex interrelated way to theresultant beam shift in partial reflection at planar dielectric interfaces.Here, we show that the angular GH and the two variants of the IF effects can bedecoupled, amplified and separately observed by weak value amplification andsubsequent conversion of spatial$\leftrightarrow$angular nature of the beamshifts using appropriate pre and post selection of polarization states. Weexperimentally demonstrate such decoupling and illustrate various otherintriguing manifestations of weak measurements by employing optimized pre andpost selections (based on the eigen polarization states of the shifts)elliptical and / or linear polarization basis. The demonstrated ability toamplify, controllably decouple or combine the beam shifts via weak measurementsmay prove to be valuable for understanding the different physical contributionsof the effects and for their applications in sensing and precision metrology

Selective observation of Goos-H\"anchen and Imbert-Federov shifts in  partial reflection via optimized weak measurements in linear and elliptical  polarization basis