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We present the results of a comprehensive study of magnetic,magneto-transport and structural properties of nonstoichiometric MnxSi1-x(x=0.51-0.52) films grown by the Pulsed Laser Deposition (PLD) technique ontoAl2O3(0001) single crystal substrates at T = 340{\deg}C. A highlight of our PLDmethod is the using of non-conventional (shadow) geometry with Kr as ascattering gas during the sample growth. It is found that studied films exhibithigh-temperature (HT) ferromagnetism (FM) with the Curie temperature TC ~ 370 Kaccompanied by positive sign anomalous Hall effect (AHE); they also reveal thelayered polycrystalline structure with a self-organizing grain sizedistribution. The HT FM order is originated from the bottom interfacialnanocrystalline layer, while the upper layer possesses the low temperature (LT)type of FM order with TC = 46 K, gives essential contribution to themagnetization below 50 K and is homogeneous on the nanometer size scale. Underthese conditions, AHE changes its sign from positive to negative at T < 30 K.We attribute observed properties to the synergy of self-organizing distributionof MnxSi1-x crystallites in size and peculiarities of defect-induced FM orderin PLD grown polycrystalline MnxSi1-x (x~0.5) films.

Grain-size dependent high-temperature ferromagnetism of polycrystalline MnxSi1-x (x~0.5) films