English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

This paper concerns new continuum phenomenological model for epitaxial thinfilm growth with three different forms of the Ehrlich-Schwoebel current. Two ofthese forms were first proposed by Politi and Villain [1996] and then studiedby Evans, Thiel and Bartelt [2006]. The other one is completely new. Followingthe techniques used in Li and Liu [2003], we present rigorous analysis of thewell-posedness, regularity and time stability for the new model. We alsostudied both the global and the local behavior of the surface roughness in thegrowth process. The new model differs from other known models in that itfeatures a linear convex part and a nonlinear concave part, and thus by using aconvex-concave time splitting scheme, one can naturally build unconditionallystable semi-implicit numerical discretizations with linear implicit parts,which is much easier to implement than conventional models requiring nonlinearimplicit parts. Despite this fundamental difference in the model, numericalexperiments show that the nonlinear morphological instability of the new modelagrees well with results of other models published in Li and Liu [2003], whichindicates that the new model correctly captures the essential morphologicalstates in the thin film growth process.

New Epitaxial Thin Film Models and numerical approximation