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Noise from atomic tunneling systems (TSs) limit the performance of variousresonant devices, ranging in application from astronomy detectors to quantumcomputing. Using devices containing these TSs, we study the $1/f$ permittivitynoise and loss tangent in two film types containing different TS densities. Thenoise reveals an intrinsic value as well as the crossover to power-saturatednoise. The intrinsic $1/f$ noise fits to the temperature dependence$1/T^{1+\mu}$ where $0.2\le\mu\le0.7$, which is related to previous studies andstrongly interacting TS. An analysis of the noise normalized by the losstangent and temperature is quantitatively identical for two film types, despitea factor of 5 difference in their loss tangent. Following from the broadapplicability of the TS model, the data supports a universal relationship foramorphous-solid produced permittivity noise. The quantity of the observed noiseparticularly supports a recent model in which noise is created by weak TS-TSinteractions.

Evidence for universal relationship between the measured 1/f permittivity noise and loss tangent created by tunneling atoms