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We have developed a polarized hard X-ray photoemission (HAXPES) system tostudy the ground-state symmetry of strongly correlated materials. The linearpolarization of the incoming X-ray beam is switched by the transmission-typephase retarder composed of two diamond (100) crystals. The best degree of thelinear polarization $P_L$ is $-0.96$, containing the vertical polarizationcomponent of 98%. A newly developed low temperature two-axis manipulatorenables easy polar and azimuthal rotations to select the detection direction ofphotoelectrons. The lowest temperature achieved is 9 K, offering us a chance toaccess the ground state even for the strongly correlated electron systems incubic symmetry. The co-axial sample monitoring system with thelong-working-distance microscope enables us to keep measuring the same regionon the sample surface before and after rotation procedures. Combining thissample monitoring system with a micro-focused X-ray beam by means of anellipsoidal Kirkpatrick-Baez mirror (25 $\mu$m $\times$ 25 $\mu$m (FWHM)), wehave demonstrated the polarized valence-band HAXPES on NiO for voltageapplication as resistive random access memories to reveal the origin of themetallic spectral weight near the Fermi level.

Photoemission System with Polarized Hard X-rays for Probing Ground State Symmetry of Strongly Correlated Materials