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The geometric phase analysis (GPA) algorithm is known as a robust andstraightforward technique that can be used to measure lattice strains in highresolution transmission electron microscope (TEM) images. It is also attractivefor analysis of aberration-corrected scanning TEM (ac-STEM) images that resolveevery atom column, since it uses Fourier transforms and does not requirereal-space peak detection and assignment to appropriate sublattices. Here it isdemonstrated that in ac-STEM images of compound materials (i.e. with more thanone atom per unit cell) an additional phase is present in the Fouriertransform. If the structure changes from one area to another in the image (e.g.across an interface), the change in this additional phase will appear as astrain in conventional GPA, even if there is no lattice strain. Strategies toavoid this pitfall are outlined.

Artefacts in geometric phase analysis of compound materials