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We report on the growth dynamic of CdTe thin films for depositiontemperatures ($T$) in the range of $150\,^{\circ}\mathrm{C}$ to$300\,^{\circ}\mathrm{C}$. A relation between mound evolution andlarge-wavelength fluctuations at CdTe surface has been established. One findsthat short-length scales are dictated by an interplay between the effects ofthe formation of defects at boundaries of neighbouring grains and a relaxationprocess which stems from the diffusion and deposition of particles (CdTemolecules) torward these regions. A Kinetic Monte Carlo model corroboratesthese reasonings. As $T$ is increased, the competition gives rise to differentscenarios in the roughening scaling such as: uncorrelated growth, a crossoverfrom random to correlated growth and transient anomalous scaling. Inparticular, for $T = 250\,^{\circ}\mathrm{C}$, one shows that surfacefluctuations are described by the celebrated Kardar-Parisi-Zhang (KPZ)equation, in the meantime that, the universality of height, local roughness andmaximal height distributions for the KPZ class is, finally, experimentallydemonstrated. The dynamic of fluctuations at the CdTe surface for othertemperatures still is described by the KPZ equation, but with different valuesfor the superficial tension ($\nu$) and excess of velocity ($\lambda$). Namely,for $T = 150\,^{\circ}\mathrm{C}$ one finds a Poissonian growth that indicates$\nu = \lambda = 0$. For $T = 200\,^{\circ}\mathrm{C}$, however, aRandom-to-KPZ crossover is found, with $\lambda > 0$ in the second regime.Finally, for films grown at $T = 300\,^{\circ}\mathrm{C}$, one demonstratesthat a KPZ growth with $\lambda < 0$ takes place. We discuss the differentmechanisms leading to KPZ scaling which depend on $T$, and conjecture thebehavior of the phenomenological parameter $\lambda$ as function of thedeposition temperature.

Kardar-Parisi-Zhang Universality, Anomalous Scaling and Crossover Effects in the Growth of Cdte Thin Films