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We implement a technique to characterize electromagnetic properties atfrequencies 100 to 165 GHz (3 cm$^{-1}$ to 4.95 cm$^{-1}$) of orientedmontmorillionite samples using an open cavity resonator connected to asub-millimeter wave VNA (Vector Network Analyzer). We measured dielectricconstants perpendicular to the bedding plane on oriented Na$^{+}$ andCa$^{++}$-ion stabilized montmorillionite samples deposited on a glass slide atambient laboratory conditions (room temperature and room light). The clay layeris much thinner ($\sim$ 30 $\mu$m) than the glass substrate ($\sim$ 2.18 mm).The real part of dielectric constant,$\epsilon_{re}$, is essentially constantover this frequency range but is larger in Na$^{+}$- than in Ca$^{++}$-ionedclay. The total electrical conductivity (associated with the imaginary part ofdielectric constant, $\epsilon_{im}$) of both samples increases monotonicallyat lower frequencies ($<$ 110 GHz), but shows rapid increase for Na$^{+}$ ionsin the regime $>$ 110 GHz. The dispersion of the samples display a dependenceon the ionic strength in the clay interlayers, i.e., $\zeta$-potential in theStern layers.

Sub-THz complex dielectric constants of montmorillionite clay thin samples with Na$^{+}$/Ca$^{++}$-ions