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In this paper we present the fluorescence decay profiles of vanadium andtitanium doped gallium lanthanum sulphide (GLS) glass at various dopingconcentrations between 0.01 and 1% (molar). We demonstrate that below acritical doping concentration the fluorescence decay profile can be fitted withthe stretched exponential function: exp[-(t/{\tau})\b{eta}], where {\tau} isthe fluorescence lifetime and \b{eta} is the stretch factor. At lowconcentrations the lifetime for vanadium and titanium doped GLS was 30 {\mu}sand 67 {\mu}s respectively. We validate the use of the stretched exponentialmodel and discuss the possible microscopic phenomenon it arises from. We alsodemonstrate that above a critical doping concentration of around 0.1% (molar)the fluorescence decay profile can be fitted with the double exponentialfunction: a*exp-(t/{\tau}1)+ b*exp-(t/{\tau}2), where {\tau}1and {\tau}2 arecharacteristic fast and slow components of the fluorescence decay profile, forvanadium the fast and slow components are 5 {\mu}s and 30 {\mu}s respectivelyand for titanium they are 15 {\mu}s and 67 {\mu}s respectively. We also showthat the fluorescence lifetime of vanadium and titanium at low concentrationsin the oxide rich host gallium lanthanum oxy-sulphide (GLSO) is 43 {\mu}s and97 {\mu}s respectively, which is longer than that in GLS. From this we deducethat vanadium and titanium fluorescing ions preferentially substitute into highefficiency oxide sites until at a critical concentration they become saturatedand low efficiency sulphide sites start to be filled.

Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass