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This paper reports the optical and structural properties of 400 nmnanocrystalline cadmium telluride thin films fabricated using a new vaporcontroller system in vacuum. This system is indeed a rotating cylinder placedin the material steam path during coating process. The upper cross section ofthe cylinder has one arc groove allowing the steam to pass through. Three typesamples were made under different vapor controlling conditions namely; withoutcontroller system (conventional method), with rotating cylinder, and with uppercross section of the cylinder alone which acts as a rotating shutter. Theprepared samples have been studied by X-ray diffraction (XRD), Field EmissionScanning Electron Microscopy (FESEM) and UV-Vis Spectroscopy techniques. Theresults show, not only the structural properties were improved by thistechnique but also the band gap of samples were changed.

The vapor controller effect on physical properties of CdTe thin films