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For the development of the X-ray Free Electron Lasers test facility (SXFEL)at SINAP, ultra-short bunch is the crucial requirement for excellent lasingperformance. It's a big challenge for deflecting cavity to measure the lengthof ultra-short bunch, and higher deflecting gradient is required for highermeasurement resolution. X-band travelling wave deflecting structure hasfeatures of higher deflecting voltage and compact structure, which is goodperformance at ultra-short bunch length measurement. In this paper, a newX-band deflecting structure has been designed operated at HEM11-2pi/3 mode. Forsuppressing the polarization of deflecting plane of the HEM11 mode, twosymmetrical caves are added on the cavity wall to separate two polarized modes.More details of design and simulation results are presented in this paper.

X-Band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP