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The aim of this paper is the modeling and simulation of impact of spaceradiation variability on total dose and single event effects in spaceborneelectronics. It has been shown that the simultaneous thermal annealing may leadto non-stationary relaxation after dose-rate peaks. Significant enhancement ofsoft error rate during solar flares in the memories mitigated by the scrubbingdue to non-linear dependence on particle flux has been revealed.

Space environments variability and its impact on total dose and single event effects in electronic parts