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Dipole-coupled nanomagnetic logic (NML), where nanomagnets with bistablemagnetization states act as binary switches and information is transferredbetween them via dipole coupling and Bennett clocking, is a potentialreplacement for conventional transistor logic since magnets dissipate lessenergy than transistors when they switch in response to the clock. However,dipole-coupled NML is much more error-prone than transistor logic becausethermal noise can easily disrupt magnetization dynamics. Here, we study aparticularly energy-efficient version of dipole-coupled NML known asstraintronic multiferroic logic (SML) where magnets are clocked/switched withelectrically generated mechanical strain. By appropriately shaping the voltagepulse that generates strain, the error rate in SML can be reduced to tolerablelimits. In this paper, we describe the error probabilities associated withvarious stress pulse shapes and discuss the trade-off between error rate andswitching speed in SML.

Reducing error rates in straintronic multiferroic dipole-coupled nanomagnetic logic by pulse shaping