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We describe a field-driven domain wall creep-based method for thequantification of interfacial Dzyaloshinskii-Moriya interactions (DMI) inperpendicularly magnetized thin films. The use of only magnetic fields to drivewall motion removes the possibility of mixing with current-related effects suchas spin Hall effect or Rashba field, as well as the complexity arising fromlithographic patterning. We demonstrate this method on sputtered Pt/Co/Ir/Ptmultilayers with a variable Ir layer thickness. By inserting an ultrathin layerof Ir at the Co/Pt interface we can reverse the sign of the effective DMIacting on the sandwiched Co layer, and therefore continuously change the domainwall (DW) structure from right- to the left-handed N\'{e}el wall. We also showthat the DMI shows exquisite sensitivity to the exact details of the atomicstructure at the film interfaces by comparison with a symmetric epitaxialPt/Co/Pt multilayer.

DMI meter: Measuring the Dzyaloshinskii-Moriya interaction inversion in Pt/Co/Ir/Pt multilayers