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The superconductor-insulator (SI) transition in two-dimensional Ta thin filmsis investigated by controlling both film thickness and magnetic field. Anintriguing metallic phase intervening superconductor and an insulator phase isobserved within a narrow range of film thickness and magnetic field. Finitescaling analysis has been performed to investigate the nature of the SItransition in the thickness-tuned metallic and superconducting samples. Thecritical exponents in the disorder-induced metallic samples are clearlydifferent from the exponents obtained in the superconducting samples. Dynamicalexponent z of the superconducting samples is consistent with the theoreticalpredictions (z = 1), while the exponent for the metallic samples isapproximately 0.7. The discrepancy in the transition behaviors supports thatthe disorder induced metallic phase cannot be classified to the sameuniversality class of the superconducting Ta thin films.

Scaling analysis of field-induced superconductor-insulator transition in two-dimensional tantalum thin films