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Transport characterizations of epitaxial La0.7Sr0.3MnO3 thin films in thethickness range 5-40 nm and 25-410 K temperature interval have been accuratelycollected. We show that taking into account polaronic effects allows to achievethe best ever fitting of the transport curves in the whole temperature range.The Current Carriers Density Collapse picture accurately accounts for theproperties variation across the metal-insulator-transition. The electron-phononcoupling parameter estimations are in a good agreement with theoreticalpredictions. The results promote a clear and straightforward quantitativedescription of the manganite films involved in charge transport deviceapplications.

A novel picture for charge transport interpretation in epitaxial manganite thin films