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The gap between cell and module efficiency is a major challenge for allphotovoltaic (PV) technologies. For monolithic thin film PV modules, asignificant fraction of this gap has been attributed to parasitic shunts, andother defects, distributed across the module. In this paper, we show that it ispossible to contain or isolate these shunt defects, using the state of the artlaser scribing processes, after the fabrication of the series connected moduleis finished. We discuss three possible alternatives, and quantify theperformance gains for each technique. We demonstrate that using thesetechniques, it is possible to recover up to 50% of the power lost to parasiticshunts, which results in 1-2% (absolute) increase in module efficiencies fortypical thin film PV technologies.

In-Line Post-Process Scribing for Reducing Cell to Module Efficiency Gap in Monolithic Thin Film Photovoltaics