English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

A new experimental equipment allowing to study the sputtering induced by ionbeam irradiation is presented. The sputtered particles are collected on acatcher which is analyzed in situ by Auger electron spectroscopy withoutbreaking the ultra high vacuum (less than 10-9mbar), avoiding thus any problemlinked to possible contamination. This method allows to measure the angulardistribution of sputtering yield. Thanks to this new setup it is now possibleto study the sputtering of many elements especially light elements such ascarbon based materials. Preliminary results are presented in the case of highlyoriented pyrolytic graphite and tungsten irradiated by an Ar+ beam atrespectively 2.8 keV and 7 keV.

New experimental setup for in situ measurement of slow ion induced sputtering